Fig. 8
From: Overcoming failure: improving acceptance and success of implanted neural interfaces
Overview of testing methods used to evaluate implanted neural interface systems. Benchtop methods include the adhesion test of the electrode material, accelerated aging of the implanted portion of the device, electrochemical measures such as CSC, CIL, EIS, and common-ground impedance, fatigue testing of lead wires, and SEM of the electrode surface. In vivo testing includes testing serum and CSF samples, electrochemical measures, and electrophysiology of evoked responses. Post-explant testing includes electrochemical measures on the explanted electrodes and SEM of the electrode surface. Post-mortem analysis includes trace analysis and histological examination of tissues